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MEFAS,
Inc. is the largest as well as best equipped organization in the Microelectronics
testing, qualification, and characterization industry segment. Our team consists of over 40 engineers and
technicians possessing a combined experience of over 625 man-years in the
failure analysis, characterization, and testing of semiconductor devices. Over
the course of the past ten years of operation our 15,000 sq. ft. analytical
lab has been utilized to provide over 22,000 detailed analyses of
semiconductor device failure, 41 million device hours of Reliability and life
cycle testing, 17 million device temperate cycles, and over 31,000 hours of
circuit modification performed using Focused Ion Beam techniques. Our
current customer base of 680 includes some of the largest manufacturers,
designers, and distributors of semiconductor devices on three
continents. In the past decade we have
provided rapid cost effective failure analysis from the device to system
level as well as reliability qualification testing and Focused Ion Beam
circuit modifications.
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Home • Failure Analysis • FIB • ESD • Reliability Qualifications |
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