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MEFAS has experience with analysis that goes beyond the discrete component level. We have performed successful analysis for circuit problems occurring at the system level for the aerospace industry, medical test equipment, etc. These have included field and manufacturing test failures of:

  • Printed Circuit Board (PCB) Assemblies
  • Hybrid Microcircuits including RF IC’s or MMICs
  • Crystal oscillators
  • Flex card assemblies
  • Component solder connection failures
  • Cable harness assemblies
  • Connectors
  • Coil devices (Solenoids, transformers, etc.)
  • Optoelectronic devices
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